Journey to Data Quality

Journey to Data Quality by Yang W. Lee & Leo L. Pipino & James D. Funk & Richard Y. Wang
QTY
-+
$48.99
 
 


ISBN
9780262513357
Date Released
Binding
Paperback
Pages
226
Dimensions
147 x 229 x 20mm

Only available to order
Estimated 10 - 14 business days until dispatch

Other Titles by Yang W. Lee & Leo L. Pipino & James D. Funk & Richard Y. Wang

eBook
$42.99
Instant Download
Description
Information
ISBN:
9780262513357
Publication Date:
30 / 09 / 2009
Pages:
226
Dimensions:
147 x 229 x 20mm

You might also like