VLSI Test Principles And Architectures

By: Laung-terng Wang & Cheng-Wen Wu & Xiaoqing Wen

$187.99
 
 
ISBN
9780123705976
Date Released
Binding
Hardcover
Pages
777
Dimensions
191 x 235 x 51mm

Out of Print

Description
Information
ISBN:
9780123705976
Publication Date:
07 / 07 / 2006
Pages:
777
Dimensions:
191 x 235 x 51mm

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