VLSI Test Principles and Architectures

By: Xiaoqing Wen, Laung-Terng Wang

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$126.99
 
 
ISBN
9780080474793
Date Released
Binding
eBook
 
 

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Description
Information
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
ISBN:
9780080474793
Publication Date:
14 / 08 / 2006

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