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    VLSI Test Principles and Architectures

    By: Cheng-Wen Wu, Laung-Terng Wang

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    This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

    · Most up-to-date coverage of design for testability.
    · Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books.
    · Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
    · Lecture slides and exercise solutions for all chapters are now available.
    · Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.

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