VLSI Test Principles And Architectures

VLSI Test Principles And Architectures by Laung-terng Wang & Cheng-Wen Wu & Xiaoqing Wen
By: Laung-terng Wang & Cheng-Wen Wu & Xiaoqing Wen
QTY
-+
$208.99
 
 


ISBN
9780123705976
Date Released
Binding
Hardcover
Pages
777
Dimensions
191 x 235 x 51mm

Only available to order
Estimated 10 - 14 business days until dispatch

Other Titles by Laung-terng Wang & Cheng-Wen Wu & Xiaoqing Wen

Description
Information
ISBN:
9780123705976
Publication Date:
07 / 07 / 2006
Pages:
777
Dimensions:
191 x 235 x 51mm

You might also like